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  • IC型号
  • 描述
  • 厂家
  • 页数
  • 文件大小
  • 51
  • SN74ABTH16244DGG
  • Texas Instruments Incorporated
  • 16 Bit Buffers/Drivers with 3-State Outputs
  • 7页
  • 107K
  • 52
  • SN74ABTH162260DL
  • Texas Instruments Incorporated
  • 12 Bit to 24 Bit Multiplexed D-Type Latches with Series-Damping Resistors and 3-State Outputs
  • 8页
  • 137K
  • 53
  • SN74ABTH162245DL
  • Texas Instruments Incorporated
  • 16 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 119K
  • 54
  • SN74ABTH162245DGV
  • Texas Instruments Incorporated
  • 16 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 119K
  • 55
  • SN74ABTH162245DGG
  • Texas Instruments Incorporated
  • 16 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 119K
  • 56
  • SN74ABTE16246DLR
  • Texas Instruments Incorporated
  • 11 Bit Incident-Wave Switching Bus Transceiver with 3-State and Open-Collector Outputs
  • 10页
  • 143K
  • 57
  • SN74ABTE16246DL
  • Texas Instruments Incorporated
  • 11 Bit Incident-Wave Switching Bus Transceiver with 3-State and Open-Collector Outputs
  • 10页
  • 143K
  • 58
  • SN74ABTE16246DGGR
  • Texas Instruments Incorporated
  • 11 Bit Incident-Wave Switching Bus Transceiver with 3-State and Open-Collector Outputs
  • 10页
  • 143K
  • 59
  • SN74ABTE16245DLR
  • Texas Instruments Incorporated
  • 16 Bit Incident-Wave Switching Bus Transceiver with 3-State Outputs
  • 9页
  • 134K
  • 60
  • SN74ABTE16245DL
  • Texas Instruments Incorporated
  • 16 Bit Incident-Wave Switching Bus Transceiver with 3-State Outputs
  • 9页
  • 134K
  • 61
  • SN74ABTE16245DGGR
  • Texas Instruments Incorporated
  • 16 Bit Incident-Wave Switching Bus Transceiver with 3-State Outputs
  • 9页
  • 134K
  • 62
  • SN74ABT8996PW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 40页
  • 564K
  • 63
  • SN74ABT8996DW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 40页
  • 564K
  • 64
  • SN74ABT8952DW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 24页
  • 364K
  • 65
  • SN74ABT8952DL
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 24页
  • 364K
  • 66
  • SN74ABT8652DW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 25页
  • 365K
  • 67
  • SN74ABT8652DL
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 25页
  • 365K
  • 68
  • SN74ABT8646DW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 27页
  • 386K
  • 69
  • SN74ABT8646DL
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 27页
  • 386K
  • 70
  • SN74ABT863PW
  • Texas Instruments Incorporated
  • 9 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 123K
  • 71
  • SN74ABT863NT
  • Texas Instruments Incorporated
  • 9 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 123K
  • 72
  • SN74ABT863DW
  • Texas Instruments Incorporated
  • 9 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 123K
  • 73
  • SN74ABT863DB
  • Texas Instruments Incorporated
  • 9 Bit Bus Transceiver with 3-State Outputs
  • 8页
  • 123K
  • 74
  • SN74ABT861NT
  • Texas Instruments Incorporated
  • 10 Bit Transceiver with 3-State Outputs
  • 7页
  • 118K
  • 75
  • SN74ABT861DW
  • Texas Instruments Incorporated
  • 10 Bit Transceiver with 3-State Outputs
  • 7页
  • 118K
  • 76
  • SN74ABT8543DW
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 25页
  • 356K
  • 77
  • SN74ABT8543DL
  • Texas Instruments Incorporated
  • SCAN Bridge, JTAG Test Port
  • 25页
  • 356K
  • 78
  • SN74ABT853PW
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceivers
  • 9页
  • 140K
  • 79
  • SN74ABT853NT
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceivers
  • 9页
  • 140K
  • 80
  • SN74ABT853DW
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceivers
  • 9页
  • 140K
  • 81
  • SN74ABT853DB
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceivers
  • 9页
  • 140K
  • 82
  • SN74ABT843NT
  • Texas Instruments Incorporated
  • 9 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 8页
  • 120K
  • 83
  • SN74ABT843DW
  • Texas Instruments Incorporated
  • 9 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 8页
  • 120K
  • 84
  • SN74ABT843DB
  • Texas Instruments Incorporated
  • 9 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 8页
  • 120K
  • 85
  • SN74ABT841NT
  • Texas Instruments Incorporated
  • 10-BIT BUS-INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS
  • 7页
  • 110K
  • 86
  • SN74ABT841DW
  • Texas Instruments Incorporated
  • 10-BIT BUS-INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS
  • 7页
  • 110K
  • 87
  • SN74ABT841DB
  • Texas Instruments Incorporated
  • 10-BIT BUS-INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS
  • 7页
  • 110K
  • 88
  • SN74ABT841APW
  • Texas Instruments Incorporated
  • 10 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 7页
  • 109K
  • 89
  • SN74ABT841ANT
  • Texas Instruments Incorporated
  • 10 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 7页
  • 109K
  • 90
  • SN74ABT841ADW
  • Texas Instruments Incorporated
  • 10 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 7页
  • 109K
  • 91
  • SN74ABT841ADB
  • Texas Instruments Incorporated
  • 10 Bit Bus-Interface D-Type Latch with 3-State Outputs
  • 7页
  • 109K
  • 92
  • SN74ABT833NT
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceiver
  • 9页
  • 154K
  • 93
  • SN74ABT833DW
  • Texas Instruments Incorporated
  • 8 Bit to 9 Bit Parity Bus Transceiver
  • 9页
  • 154K
  • 94
  • SN74ABT827PW
  • Texas Instruments Incorporated
  • 10 Bit Buffer/Driver with 3-State Outputs
  • 6页
  • 95K
  • 95
  • SN74ABT827NT
  • Texas Instruments Incorporated
  • 10 Bit Buffer/Driver with 3-State Outputs
  • 6页
  • 95K
  • 96
  • SN74ABT827DW
  • Texas Instruments Incorporated
  • 10 Bit Buffer/Driver with 3-State Outputs
  • 6页
  • 95K
  • 97
  • SN74ABT827DB
  • Texas Instruments Incorporated
  • 10 Bit Buffer/Driver with 3-State Outputs
  • 6页
  • 95K
  • 98
  • SN74ABT8245DW
  • Texas Instruments Incorporated
  • SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVER
  • 24页
  • 342K
  • 99
  • SN74ABT8245DW
  • Texas Instruments Incorporated
  • SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS
  • 24页
  • 2122K
  • 100
  • SN74ABT823NT
  • Texas Instruments Incorporated
  • 9 Bit Bus-Interface Flip-Flop with 3-State Outputs
  • 7页
  • 109K
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