• 401
• SN54F240FK
• Texas Instruments Incorporated
• Octal Buffer/Driver with 3-State Outputs
• 5页
• 72K

• 402
• SN54F21J
• Texas Instruments Incorporated
• Dual 4-Input Positive-AND Gates
• 5页
• 67K

• 403
• SN54F21FK
• Texas Instruments Incorporated
• Dual 4-Input Positive-AND Gates
• 5页
• 67K

• 404
• SN54F20J
• Texas Instruments Incorporated
• Dual 4-Input Positive-NAND Gates
• 5页
• 68K

• 405
• SN54F20FK
• Texas Instruments Incorporated
• Dual 4-Input Positive-NAND Gates
• 5页
• 68K

• 406
• SN54F158AJ
• Texas Instruments Incorporated
• Quadruple 2 Line to 1 Line Data Selector/Multiplexer
• 5页
• 72K

• 407
• SN54F158AFK
• Texas Instruments Incorporated
• Quadruple 2 Line to 1 Line Data Selector/Multiplexer
• 5页
• 72K

• 408
• SN54F157AJ
• Texas Instruments Incorporated
• Quadruple 2 Line to 1 Line Data Selectors/Multiplexers
• 5页
• 72K

• 409
• SN54F157AFK
• Texas Instruments Incorporated
• Quadruple 2 Line to 1 Line Data Selectors/Multiplexers
• 5页
• 72K

• 410
• SN54F153J
• Texas Instruments Incorporated
• Dual 1 of 4 Data Selectors/Multiplexers
• 23页
• 261K

• 411
• SN54F153FK
• Texas Instruments Incorporated
• Dual 1 of 4 Data Selectors/Multiplexers
• 23页
• 261K

• 412
• SN54F151BJ
• Texas Instruments Incorporated
• Data Selector/Multiplexer
• 5页
• 75K

• 413
• SN54F151BFK
• Texas Instruments Incorporated
• Data Selector/Multiplexer
• 5页
• 75K

• 414
• SN54F138J
• Texas Instruments Incorporated
• 3 Line to 8 Line Decoder/Demultiplexer
• 6页
• 88K

• 415
• SN54F138FK
• Texas Instruments Incorporated
• 3 Line to 8 Line Decoder/Demultiplexer
• 6页
• 88K

• 416
• SN54F11J
• Texas Instruments Incorporated
• Triple 3-Input Positive-AND Gates
• 5页
• 67K

• 417
• SN54F11FK
• Texas Instruments Incorporated
• Triple 3-Input Positive-AND Gates
• 5页
• 67K

• 418
• SN54F10J
• Texas Instruments Incorporated
• Triple 3-Input Positive-NAND Gates
• 42页
• 437K

• 419
• SN54F10FK
• Texas Instruments Incorporated
• Triple 3-Input Positive-NAND Gates
• 42页
• 437K

• 420
• SN54F109J
• Texas Instruments Incorporated
• Dual J Inverted（K）Positive-Edge-Triggered Flip-Flops with Clear and Preset
• 5页
• 73K

• 421
• SN54F109FK
• Texas Instruments Incorporated
• Dual J Inverted（K）Positive-Edge-Triggered Flip-Flops with Clear and Preset
• 5页
• 73K

• 422
• SN54F04J
• Texas Instruments Incorporated
• Hex Inverter
• 5页
• 66K

• 423
• SN54F04FK
• Texas Instruments Incorporated
• Hex Inverter
• 5页
• 66K

• 424
• SN54F02J
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-NOR Gates
• 72页
• 796K

• 425
• SN54F02FK
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-NOR Gates
• 72页
• 796K

• 426
• SN54F00J
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-NAND Gates
• 5页
• 68K

• 427
• SN54F00FK
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-NAND Gates
• 5页
• 68K

• 428
• SN54CDC586
• Texas Instruments Incorporated
• 3.3-V PHASE-LOCK-LOOP CLOCK DRIVER WITH 3-STATE OUPUTS
• 11页
• 150K

• 429
• SN54CDC341W
• Texas Instruments Incorporated
• 1-LINE TO 8-LINE CLOCK DRIVER
• 9页
• 136K

• 430
• SN54CDC341J
• Texas Instruments Incorporated
• 1-LINE TO 8-LINE CLOCK DRIVER
• 9页
• 136K

• 431
• SN54CDC341FK
• Texas Instruments Incorporated
• 1-LINE TO 8-LINE CLOCK DRIVER
• 9页
• 136K

• 432
• SN54BCT8374AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 293K

• 433
• SN54BCT8374AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 293K

• 434
• SN54BCT8373AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 293K

• 435
• SN54BCT8373AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 293K

• 436
• SN54BCT8245AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 22页
• 308K

• 437
• SN54BCT8245AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 22页
• 308K

• 438
• SN54BCT8244AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 292K

• 439
• SN54BCT8244AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 292K

• 440
• SN54BCT8240AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 292K

• 441
• SN54BCT8240AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 21页
• 292K

• 442
• SN54BCT760W
• Texas Instruments Incorporated
• Octal Buffer/Driver with Open-Collector Outputs
• 5页
• 71K

• 443
• SN54BCT760J
• Texas Instruments Incorporated
• Octal Buffer/Driver with Open-Collector Outputs
• 5页
• 71K

• 444
• SN54BCT760FK
• Texas Instruments Incorporated
• Octal Buffer/Driver with Open-Collector Outputs
• 5页
• 71K

• 445
• SN54BCT652W
• Texas Instruments Incorporated
• Octal Bus Transceiver and Register with 3-State Outputs
• 7页
• 112K

• 446
• SN54BCT652JT
• Texas Instruments Incorporated
• Octal Bus Transceiver and Register with 3-State Outputs
• 7页
• 112K

• 447
• SN54BCT652FK
• Texas Instruments Incorporated
• Octal Bus Transceiver and Register with 3-State Outputs
• 7页
• 112K

• 448
• SN54BCT648W
• Texas Instruments Incorporated
• OCTAL BUS TRANSCEIVER AND REGISTERS WITH 3-STATE OUTPUTS
• 8页
• 121K

• 449
• SN54BCT648JT
• Texas Instruments Incorporated
• OCTAL BUS TRANSCEIVER AND REGISTERS WITH 3-STATE OUTPUTS
• 8页
• 121K

• 450
• SN54BCT648FK
• Texas Instruments Incorporated
• OCTAL BUS TRANSCEIVER AND REGISTERS WITH 3-STATE OUTPUTS
• 8页
• 121K

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